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GENERAL
CHARACTERIZATION FACILITIES
- Advanced Electron Microscopy and Spectroscopy
A cooperative arrangement with the SHaRE User Program provides access to a
variety of advanced SEM, TEM, and STEM equipment and expertise located
on ORNL's main campus. Advanced capabilities include atomic resolution
imaging; a ‘bolometric’ X-ray detector for high performance microanalysis
at low beam energies; a Scanning Auger Microprobe for nanometer-scale surface
microanalysis and depth profiling; electron holography; a fully automated
electron microprobe for trace element determinations; and a variable pressure
SEM incorporating EDS and XRF analysis for the study of polymeric and nano-bio
samples. See Electron Microscopy, Neutron and
X-ray Scattering.
Note: SHaRE
and the High Temperature Materials Laboratory each operate their
own user program. Users needing only the capabilities of one of these
facilities and no other CNMS resources should apply directly to the
facility concerned. Such proposals will not be accepted in
the CNMS user program.
- Neutron Scattering
CNMS users are encouraged to take advantage of the world-class neutron scattering facilities that are available at ORNL’s High-Flux Isotope Reactor (HFIR) and the Spallation Neutron Source (SNS). Beamlines of particular relevance to CNMS Scientific Themes include the small-angle scattering and reflectometry instruments on the HFIR cold source, HFIR thermal neutron diffraction and spectroscopy capabilities, and early-availability instruments at SNS including the backscattering spectrometer and the liquids and magnetism reflectometers. CNMS users who may be interested in neutron scattering opportunities are encouraged to indicate their interest in the designated box on the CNMS proposal form. The CNMS will assist its users to identify the appropriate neutron scattering resources, develop competitive beamtime proposals, or collaborate with arrangements for potential access as initial users as additional instruments are commissioned.
- X-ray Diffraction and Fluorescence
See Electron Microscopy, Neutron and X-ray
Scattering
- Hitachi
HD2000 STEM and Hitachi S4700 FEG-SEM at the CNMS
The
Hitachi HD2000 STEM, offering 0.2nm resolution in transmission
mode at 200keV, and the Hitachi S4700 field emission gun SEM,
capable of better than 2nm resolution from 500eV to 30keV are
now installed in the CNMS. Both instruments are also equipped
with high performance energy dispersive X-ray spectrometers for
chemical microanalysis.
- Ambient
AFM: Force Capability
See Scanning Probes & Nanoscale Physics Capabilities
- Ambient
SPM: Electrical Characterization
See Scanning Probes & Nanoscale Physics Capabilities
- MALDI-TOF-MS
Matrix-assisted-laser
desorption ionization-time-of-flight mass spectrometer
See Macromolecular Nanomaterials Capabilities
- Thermogravimetric
Analyzer
TA Instruments 2050 with a Thermostar mass
spectrometer for analysis of evolved
gases
See Macromolecular Nanomaterials Capabilities
- Differential
Scanning Calorimeter
TA Instruments 2010, temperature
range -180–730°C
See Macromolecular Nanomaterials Capabilities
- UV-Visible-NIR
spectroscopy
Cary 5000 with transmission and diffuse
reflectance mode available
See Macromolecular Nanomaterials Capabilities
- Fluorescence
spectroscopy
Spex
Fluorolog 2
See Macromolecular Nanomaterials Capabilities
- FTIR
spectrometer (mid
and near IR regions)
Sample configurations including transmission,
diffuse reflectance, ATR, as well as an IR microscope.
See Macromolecular Nanomaterials Capabilities
- Spectroscopic
Ellipsometer
For analysis of the thickness and refractive
index of multi-layered structures
See Macromolecular Nanomaterials Capabilities
- Mechanical
Properties Microprobes (Nanoindentation)
Offered
through the SHaRE
User Program and may be requested on a CNMS proposal by attaching
the SHaRE Appendix.
- Atom
Probe Field Ion Microscopes
Offered through
the SHaRE
User Program and may be requested on a CNMS proposal by attaching
the SHaRE Appendix.
Capabilities
provided by other CNMS groups
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