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IMAGING FUNCTIONALITY CAPABILITIES
In
Situ MBE
A
variety of small sources are located in UHV chambers attached
to SEMPA, 4-probe STM, and STM/AFM chambers.
In
Situ laser MBE with RHEED, AFM/STM, surface characterization - In
Situ PLD
Laser MBE growth with
high pressure RHEED for monitored growth of metals and oxides.
- LEED
(Low Energy Electron Diffraction)
- UPS (Ultraviolet Photoemission Spectroscopy) and XPS (X-ray Photoelectron Spectroscopy)
SEMPA:
Scanning electron microscopy with polarization analysis
For
nanomagnetism studies. In-plane magnetic field up to 300 mT,
coaxial Scanning Auger Microscopy analyzer, growth and analysis
chamber with in situ MBE, MOKE, and LEED
Magnetic Property Measurement System (MPMS)
An MPMS sample magnetometer provides solutions for a unique class
of sensitive magnetic measurements in key areas such as high-temperature
superconductivity, biochemistry, and magnetic recording media.
•
High homogeneity magnet configurations of ± 7.0 Tesla
• Continuous Low Temperature Control/Temperature Sweep with Enhanced
Thermometry
• Reciprocating Sample Option (RSO) - DC Magnetization absolute
sensitivity: 1 x 10-8 emu @ 2,500 Oe
• SQUID AC Susceptibility Measurement, 0.1 Hz to 1KHz
•
Horizontal & Vertical Sample Rotators
• Fiber Optic Sample Holder
• Magnet Reset
Ultrahigh
Vacuum Cryo 4-probe STM
Four STM tips with separate control for imaging, transport measurement, and manipulation from 10–300 K, in combination with 10 nm resolution SEM and SAM analyzer. Sample prep chamber is attached with provision for MBE sources and sample cleaving. Also attached is a single tip, 50-500K STM/Q-Plus AFM for high resolution and insulating materials.
Ultrahigh
Vacuum Variable Temperature AFM/STM
- VT
Beam Deflection AFM/STM with in situ growth capabilities
Omicron
UHV AFM/STM 20–400 K, combined with in situ PLD growth of metals
or oxides with high pressure RHEED, MBE growth, UPS/XPS electron spectroscopies
and LEED.
- High Field, Low Temperature STM
State-of-the-art instrument with high stability, 4 K normal operation, 0 to 9 T magnetic field, sample cleaving at low temperature, sample prep chamber, and surface analytical chamber.
- True variable temperature STM for spectroscopy
CNMS designed instrument for single point elastic and inelastic spectroscopy from 10–200 K.
- Low temperature AFM/STM
Joule-Thomson SPECS AFM/STM for molecular imaging and spectroscopy at 1-4 K.
AFM:
Topography
Advanced
SPM: air, liquid (cAFM, PFM, ESM, MFM etc)
- Ambient Scanning Probe Microscopy
- Magnetic Force Microscopy
- Electrical Force Microscopy
- Kelvin Probe Force Microscopy
- Conductive Atomic Force Microscopy
- Piezoresponse and Electrochemical Strain Microscopy
- Band excitation PFM
- Switching spectroscopy PFM
- First order reversal curve mapping
- Time relaxation spectroscopy mapping
- Microwave Microscopy
Advanced
SPM: glove box
Capabilities
provided by other CNMS groups
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