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SCANNING
PROBES CAPABILITIES
In
Situ MBE
A
variety of small sources are located in UHV chambers attached
to SEMPA, 4-probe STM, and UHV
MOKE chambers.
In
Situ laser MBE with RHEED, AFM/STM, surface characterization - In
Situ PLD
Laser MBE growth with
high pressure RHEED for monitored growth of metals and oxides.
- LEED
(Low Energy Electron Diffraction)
- AES
(Auger Electron Spectroscopy) and XPS (X-ray Photoelectron
Spectroscopy)
SEMPA:
Scanning electron microscopy with polarization analysis
For
nanomagnetism studies. In-plane magnetic field up to 300 mT,
coaxial Scanning Auger Microscopy analyzer, growth and analysis
chamber with in situ MBE, MOKE, and LEED
Magnetic Property Measurement System (MPMS)
An MPMS sample magnetometer provides solutions for a unique class
of sensitive magnetic measurements in key areas such as high-temperature
superconductivity, biochemistry, and magnetic recording media.
•
High homogeneity magnet configurations of ± 7.0 Tesla
• Continuous Low Temperature Control/Temperature Sweep with Enhanced
Thermometry
• Reciprocating Sample Option (RSO) - DC Magnetization absolute
sensitivity: 1 x 10-8 emu @ 2,500 Oe
• SQUID AC Susceptibility Measurement, 0.1 Hz to 1KHz
•
Horizontal & Vertical Sample Rotators
• Fiber Optic Sample Holder
• Magnet Reset
Ultrahigh
Vacuum Cryo 4-probe STM
Four
STM tips with separate control for imaging, transport measurement,
and manipulation from 10–300 K, in combination with 10
nm resolution SEM and SAM analyzer. Sample prep chamber is
attached with provision for MBE sources and sample cleaving.
Ultrahigh
Vacuum Variable Temperature AFM/STM
- VT
Beam Deflection AFM/STM with in situ growth capabilities
Omicron
UHV AFM/STM 20–400 K, combined with in situ PLD growth of metals
or oxides with high pressure RHEED, MBE growth, AES/XPS electron spectroscopies
and LEED.
- Under Development: High Field, Low Temperature STM
State-of-the-art instrument with high stability, 300 mK or 4
K normal operation, 0 to 9 T magnetic field, sample cleaving
at low temperature, sample prep chamber, and surface analytical
chamber.
AFM:
Topography
Advanced
SPM: air or liquid (MFM, SCM, PFM, SSPFM etc)
- Ambient
AFM: Force Characterization
Scanning probe microscope designed for exceptional capabilities in topography
and force characterization in air and liquid environments. System includes:
- Inverted
optical microscope
- Optical
visualization, excitation, or spectroscopy with simultaneous
AFM
- Excellent
force pulling capability for use with soft materials
- Ambient
SPM: Electrical Characterization
- Scanning
Impedance – lateral
ac impedance
- Scanning
Capacitance – local
capacitance
- Scanning
Acoustic – local
elastic properties
- Piezoresponse
Force – local
piezoelectricity
- Scanning
Surface Potential – local
surface potential
- Magnetic
Force – magnetic
domains
- NanoTA – local
thermal analysis of materials, e.g., phase transition temperatures
and temperature-dependent mechanical
properties
Capabilities
provided by other CNMS groups
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