SCANNING PROBES & NANOSCALE PHYSICS CAPABILITIES

In Situ MBE

A variety of small sources are located in UHV chambers attached to SEMPA, 4-probe STM, and UHV MOKE chambers.

In Situ laser MBE with RHEED, AFM/STM, surface characterization

• In Situ PLD
  Laser MBE growth with high pressure RHEED for monitored growth of metals and oxides.
• LEED (Low Energy Electron Diffraction)
• AES (Auger Electron Spectroscopy) and XPS (X-ray Photoelectron Spectroscopy)

SEMPA: Scanning electron microscopy with polarization analysis

For nanomagnetism studies. In-plane magnetic field up to 300 mT, coaxial Scanning Auger Microscopy analyzer, growth and analysis chamber with in situ MBE, MOKE, and LEED.

Ultrahigh Vacuum Cryo 4-probe STM

Four STM tips with separate control for imaging, transport measurement, and manipulation from 10–300 K, in combination with 10 nm resolution SEM and SAM analyzer. Sample prep chamber is attached with provision for MBE sources and sample cleaving.

Ultrahigh Vacuum Variable Temperature AFM/STM

• VT Beam Deflection AFM/STM with in situ growth capabilities
  Omicron UHV AFM/STM 20–400 K, combined with in situ PLD growth of metals or oxides with high pressure RHEED, MBE growth, AES/XPS electron spectroscopies and LEED.
• Under Development: High Field, Low Temperature STM
  State-of-the-art instrument with high stability, 300 mK or 4 K normal operation, 0 to 9 T magnetic field, sample cleaving at low temperature, sample prep chamber, and surface analytical chamber.

AFM: Topography

Advanced SPM: air or liquid (MFM, SCM, PFM, SSPFM etc)

• Ambient AFM: Force Characterization
  Scanning probe microscope designed for exceptional capabilities in topography and force characterization in air and liquid environments. System includes:
  • Inverted optical microscope
  • Optical visualization, excitation, or spectroscopy with simultaneous AFM
  • Excellent force pulling capability for use with soft materials
• Ambient SPM: Electrical Characterization
  • Scanning Impedance – lateral ac impedance
  • Scanning Capacitance – local capacitance
  • Scanning Acoustic – local elastic properties
  • Piezoresponse Force – local piezoelectricity
  • Scanning Surface Potential – local surface potential
  • Magnetic Force – magnetic domains