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INTERIM
CNMS FACILITIES
The CNMS will ultimately have a complete suite of dedicated facilities housed
in a new 80,000-ft2 building adjacent to the Spallation Neutron
Source at ORNL. Prior to completion of these facilities, the CNMS is
operating a user program utilizing existing facilities and staff at ORNL.
This program is designed to build a foundation of core capabilities and
a collaborative user community that will enable a smooth transition to
full operation when construction and installation of the new CNMS facilities
are completed in 2005-2006. This page describes the equipment and facilities
that are available to support user-initiated nanoscience research projects
during this interim period. Facilities are listed according to the supported
research area with which they are most closely associated. Prospective
users should consult these descriptions and the associated scientists when
developing proposals for research at the CNMS.
Research Area: Design, Synthesis, and
Characterization of Macromolecular Materials
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Monomer
and polymer synthesis (anionic, cationic, and free-radical) laboratory
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Polymer
molecular weight characterization
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Aqueous
GPC with refractive index, UV-Vis, and light-scattering detectors
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Organic
GPC with refractive index, UV-Vis, and light-scattering detectors
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MALDI-TOF-MS
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Thermal
analysis of polymers
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TG-MS
- TA Instruments 2050 thermogravimetric analyzer with mass
spectrometric analysis of evolved gases with a Thermostar
mass spectrometer
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DSC
analysis - TA Instruments 2010 differential scanning calorimeter
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Characterization
of monomers and polymers
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Solid/Liquid
NMR - Bruker Avance 400 MHz solid/liquid NMR and 100 MHz
solid-state NMR
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GC
- Hewlett-Packard 5890 GC with FID or ECD
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GC-MS
- Hewlett-Packard 5890 GC with a 5972 mass spectrometer
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UV-Visible
spectroscopy – Cary
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Fluorescence
spectroscopy – Spex Fluorolog 2
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FTIR
analysis with NIR and photo acoustic capabilities
Research
Area: Controlled Synthesis and Assembly of Functional Nanomaterials
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Laser
Vaporization Production of Single-Walled Carbon Nanotubes (SWNTs)
SWNTs
are produced by pulsed Nd:YAG laser-irradiation (30 Hz, Q-switched
or free-running) of composite pellets in a 2" tube furnace
with variable pressure control.
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Chemical
Vapor Deposition of Carbon Nanotubes with in situ Diagnostics
CVD system in a 3"-i.d. tube furnace (1200 °C) with pressures
down to ~ 1 Torr and fast-acting electropneumatic valves for switching
source gases; integrated laser spectroscopic diagnostics.
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Plasma
Enhanced Carbon Nanofiber Growth Facility –
DC-plasma enhanced (glow discharge) carbon nanofiber growth chamber coupled
with e-beam evaporator (for deposition of metal catalysts and buffer layers)
and SEM-based e-beam lithography system.
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Spectroscopic
Diagnostics Facility for Nanomaterial and Thin Film Growth by
Laser Vaporization
Time-resolved imaging (gated-ICCD, 5-ns) and spectroscopy (LIF, OAS, OES,
Rayleigh scattering, PL) of laser-vaporized targets.
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Confocal
Polarized MicroRaman Spectrometry -
Modified Renishaw 1000 spectrometer uses two excitation wavelengths (785
nm, 633 nm) and 3-dim rotation and translations to measure SWNT purity
as well as alignment and dispersion in polymer composites.
- UV-VIS-NIR
Absorption Spectrophotometer (Cary 5000)
Provides optical absorption spectra to investigate electronic energy levels
and dispersion of solubilized nanomaterials.
- UV-VIS-NIR
Fluorometer (JY Fluorolog 3)
Utilizes dispersed Xe lamp to excite fluorescence of solubilized or solid
specimens. Two spectrometers (UV-VIS, and NIR) under computer control record
fluorescence spectra. Excitation wavelength can be scanned to provide complete
fluorescence maps vs. excitation wavelength.
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MALDI
Time-of-Flight Mass Spectrometer -
A linear MALDI TOF-MS with 30kV post-acceleration for the detection of
heavy molecules.
Synthetic
organic and polymer chemistry laboratories for purification,
functionalization, and characterization of SWNTs.
- Thermal
analysis of nanotubes: TG-MS and TGA
TA Instruments 2050 thermogravimetric analyzer with mass spectrometric analysis
of evolved gases with a Thermostar mass spectrometer, and standalone thermogravimetric
analyzer (TA Instruments Q500) used for thermal decomposition studies of
nanotubes and composites.
- Differential
Scanning Calorimeter (TA Instruments Q100)
For
glass transition temperature measurements of polymer nanocomposites.
- Electrochemical
Analyzer (BAS Epsilon)
Investigations of reduction-oxidation reactions. nA sensitivity using Faraday
cage with three-electrode stand.
- Combined
SEM Imaging and I-V Measurements of Nanotube-Polymer Thin Films
Special biased SEM stage permits imaging of nanotubes/nanowires inside polymer
thin films during current-voltage measurements to determine which nanotubes
participate in conduction, and voltage maps. EBIC (electron beam-induced
current) imaging provides direct imaging of conductive paths.
- Synthetic
organic and polymer chemistry laboratories for purification, functionalization,
and characterization of SWNTs
Click here for
more information...
Research
Area: Nanofabrication Research Laboratory
- Complete
photolithographic processing using i-line 5x reduction step and repeat
photolithography system (0.35 µm resolution, less than
50 nm overlay), compatible with 1 cm2 chips and with
3", 4", 5", 6" and 8" round substrates
- Comprehensive
high resolution analytical scanning electron microscopy (Hitachi
S-4700) including EDS, EBIC and electron-beam lithography to
~30 nm linewidth
- Scanning
probe microscopy including contact, tapping, and phase mode AFM
imaging on substrates from small pieces to 6" wafers
- High
selectivity reactive ion etching of Si, SiO2, Si3N4,
GaAs, Al, W, Mo, Ti, Ge and polymers
- Plasma-enhanced
chemical vapor deposition of high quality Si, SiO2 and
Si3N4 thin films
- Chemical-mechanical
polishing
- Ion
beam milling, ion beam sputtering and ion beam assisted deposition
system, for substrates from small pieces to 6" diameter
- Wet
chemical etching
- Physical
vapor deposition of metallic thin films
- Wafer
dicing and packaging
- Measurements
of thin film thickness and optical constants using spectroscopic
reflectometry
- Optical
microscopy and scanning profilometry
- Analysis
of electrical properties of devices and materials from DC to
~ 6 GHz
Click here for detailed
equipment descriptions.
Research
Area: Nanoscale Imaging and Characterization
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